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[IEEE Conference Record of the IEEE Industry Applications Society Annual Meeting - San Diego, CA, USA (1-5 Oct. 1989)] Conference Record of the IEEE Industry Applications Society Annual Meeting - Development of a second breakdown model for bipolar transistors
Menhart, S., Portnoy, W.M.Year:
1989
Language:
english
DOI:
10.1109/ias.1989.96802
File:
PDF, 549 KB
english, 1989