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X-ray/Atomic Force Microscopy Study of the Temperature-Dependent Multilayer Structure of PTCDI-C 8 Films on SiO 2
Krauss, Tobias N., Barrena, Esther, de Oteyza, Dimas G., Zhang, Xue N., Major, János, Dehm, Volker, Würthner, Frank, Dosch, HelmutVolume:
113
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/jp808037w
Date:
March, 2009
File:
PDF, 1.22 MB
english, 2009