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Texture analysis with a time-of-flight neutron strain scanner
Malamud, Florencia, Santisteban, Javier R., Vicente Alvarez, Miguel Angel, Bolmaro, Raúl, Kelleher, Joe, Kabra, Saurabh, Kockelmann, WinfriedVolume:
47
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/s1600576714012710
Date:
August, 2014
File:
PDF, 2.19 MB
english, 2014