[IEEE 2014 IEEE 6th International Memory Workshop (IMW) - Taipei, Taiwan (2014.5.18-2014.5.21)] 2014 IEEE 6th International Memory Workshop (IMW) - Extremely small resistive random access memory test cell structure with removable and movable bottom electrode
Kohl, Sang-Gyu, Sawai, Yusuke, Kishida, Satoru, Kinoshita, KentaroYear:
2014
Language:
english
DOI:
10.1109/imw.2014.6849359
File:
PDF, 1.27 MB
english, 2014