Rayleigh-Scattering-Induced RIN and Amplitude-to-Phase...

IEEE Photonics Journal 2013 / 04 Vol. 5; Iss. 2

Rayleigh-Scattering-Induced RIN and Amplitude-to-Phase Conversion as a Source of Length-Dependent Phase Noise in OEOs

Docherty, A., Menyuk, C. R., Cahill, J. P., Okusaga, O., Weimin Zhou,
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Volume:
5
Language:
english
Journal:
IEEE Photonics Journal
DOI:
10.1109/jphot.2013.2250940
Date:
April, 2013
File:
PDF, 1.07 MB
english, 2013
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