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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Recognition of Sensitized Longest Paths in Transition Delay Test
Hamada, Shuji, Maeda, Toshiyuki, Takatori, Atsuo, Noduyama, Yasuyuki, Sato, YasuoYear:
2006
Language:
english
DOI:
10.1109/test.2006.297622
File:
PDF, 252 KB
english, 2006