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Effect of primary beam energy on the secondary-ion sputtering efficiency of liquid secondary-ionization mass spectrometry in the 5-30-keV range
Aberth, William H., Burlingame, A. L.Volume:
60
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00165a016
Date:
July, 1988
File:
PDF, 321 KB
english, 1988