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Modeling of Degradation Effects on the High Frequency Noise of Metal–Oxide–Semiconductor Field-Effect Transistors
Teng, Heng-Fa, Jang, S.-L., Juang, M.-H.Volume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.44.38
Date:
January, 2005
File:
PDF, 245 KB
english, 2005