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Elimination of defects in In–Mg codoped GaN layers probed by strain analysis
Fu, Binglei, Liu, Zhe, Liu, Naixin, Li, Zhi, Si, Zhao, Wei, Xuecheng, Sun, Baojuan, Ma, Ping, Wei, Tongbo, Li, Jinmin, Wang, JunxiVolume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/jjap.53.060301
Date:
June, 2014
File:
PDF, 607 KB
english, 2014