Silicon ion interactions measured in the E-810 TPC at the AGS
B.E. Bonner, J.A. Buchanan, C.S. Chan, C.N. Chiou, J.M. Clement, M.D. Corcoran, S.E. Eiseman, A. Etkin, K.J. Foley, R.W. Hackenburg, T.J. Hallman, M.A. Kramer, J.W. Kruk, S.J. Lindenbaum, R.S. LongacrVolume:
525
Year:
1991
Language:
english
Pages:
4
DOI:
10.1016/0375-9474(91)90392-j
File:
PDF, 315 KB
english, 1991