Nondestructive Ion Trap Mass Analysis at High Pressure

Nondestructive Ion Trap Mass Analysis at High Pressure

Xu, Wei, Maas, Jeffrey B., Boudreau, Frank J., Chappell, William J., Ouyang, Zheng
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Volume:
83
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac1027808
Date:
February, 2011
File:
PDF, 2.29 MB
english, 2011
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