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[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Reliability Analysis for Integrated Circuit Amplifiers Used in Neural Measurement Systems
Hellwege, Nico, Heidmann, Nils, Peters-Drolshagen, Dagmar, Paul, SteffenYear:
2013
Language:
english
DOI:
10.7873/date.2013.153
File:
PDF, 282 KB
english, 2013