Atomic-Resolution Imaging of the Nanoscale Origin of...

Nano Letters 2008 / 09 Vol. 8; Iss. 9

Atomic-Resolution Imaging of the Nanoscale Origin of Toughness in Rare-Earth Doped SiC

Kueck, Aaron M., Kim, Do Kyung, Ramasse, Quentin M., De Jonghe, L. C., Ritchie, R. O.
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Volume:
8
Language:
english
Journal:
Nano Letters
DOI:
10.1021/nl8017884
Date:
September, 2008
File:
PDF, 2.00 MB
english, 2008
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