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[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - A simulator for evaluating redundancy analysis algorithms of repairable embedded memories
Rei-Fu Huang,, Jin-Fu Li,, Jen-Chieh Yeh,, Cheng-Wen Wu,Year:
2002
Language:
english
DOI:
10.1109/mtdt.2002.1029766
File:
PDF, 274 KB
english, 2002