[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Off-state mode TDDB reliability for ultra-thin gate oxides: New methodology and the impact of oxide thickness scaling
Wu, E., Nowak, E., Wing Lai,Year:
2004
Language:
english
DOI:
10.1109/relphy.2004.1315306
File:
PDF, 910 KB
english, 2004