Identifying Diversity in Nanoscale Electrical Break...

Journal of the American Chemical Society 2010 / 07 Vol. 132; Iss. 26

Identifying Diversity in Nanoscale Electrical Break Junctions

Martín, Santiago, Grace, Iain, Bryce, Martin R., Wang, Changsheng, Jitchati, Rukkiat, Batsanov, Andrei S., Higgins, Simon J., Lambert, Colin J., Nichols, Richard J.
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Volume:
132
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja103327f
Date:
July, 2010
File:
PDF, 2.78 MB
english, 2010
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