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Transient Response of Semiconductor Electronics to Ionizing Radiation. Recent Developments in Charge-Collection Measurement
McMorrow, Dale, Ferlet-Cavrois, Veronique, Paillet, Philippe, Duhamel, Olivier, Baggio, Jacques, Boos, J. Brad, Melinger, Joseph S.Volume:
54
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2007.896345
Date:
August, 2007
File:
PDF, 804 KB
english, 2007