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Lattice strain in ion-bombarded Si studied by X-ray Moiré technique
L. Gerward, G. Christiansen, A. Lindegaard AndersenVolume:
39
Year:
1972
Language:
english
Pages:
2
DOI:
10.1016/0375-9601(72)90329-5
File:
PDF, 198 KB
english, 1972