In situ investigation of ion-induced dewetting of a thin iron-oxide film on silicon by high resolution scanning electron microscopy
Amirthapandian, S., Schuchart, F., Garmatter, D., Bolse, W.Volume:
112
Year:
2012
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4767068
File:
PDF, 1.91 MB
english, 2012