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[IEEE 2009 European Conference on Circuit Theory and Design (ECCTD 2009) - Antalya, Turkey (2009.08.23-2009.08.27)] 2009 European Conference on Circuit Theory and Design - SAT-based ATPG testing of inter- and intra-gate bridging faults
Nakura, Tom, Tatemura, Yutaro, Fey, Gorschwin, Ikeda, Makoto, Komatsu, Satoshi, Asada, KunihiroYear:
2009
Language:
english
DOI:
10.1109/ecctd.2009.5275065
File:
PDF, 517 KB
english, 2009