Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic...

Analytical Chemistry 2007 / 05 Vol. 79; Iss. 10

Metal-Assisted Secondary Ion Mass Spectrometry Using Atomic (Ga + , In + ) and Fullerene Projectiles

Delcorte, A., Yunus, S., Wehbe, N., Nieuwjaer, N., Poleunis, C., Felten, A., Houssiau, L., Pireaux, J.-J., Bertrand, P.
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Volume:
79
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac062406l
Date:
May, 2007
File:
PDF, 2.53 MB
english, 2007
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