[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Unidirectional error detection, localization and correction for DRAMs: Application to on-line DRAM repair strategies
Madalin, Neagu, Miclea, Liviu, Figueras, JoanYear:
2011
Language:
english
DOI:
10.1109/iolts.2011.5994540
File:
PDF, 611 KB
english, 2011