High-Throughput Measurement of the Seebeck Coefficient and...

High-Throughput Measurement of the Seebeck Coefficient and the Electrical Conductivity of Lithographically Patterned Polycrystalline PbTe Nanowires

Yang, Yongan, Taggart, David K., Cheng, Ming H., Hemminger, John C., Penner, Reginald M.
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Volume:
1
Language:
english
Journal:
The Journal of Physical Chemistry Letters
DOI:
10.1021/jz101128d
Date:
October, 2010
File:
PDF, 3.77 MB
english, 2010
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