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Study of an anderson negative - U system by means of hall mobility measurements in silicon
Bogdanski, P., Carin, R., Cruege, F., Hairie, A., Madelon, R., Metzner, M. N.Volume:
126
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420159308219722
Date:
March, 1993
File:
PDF, 228 KB
english, 1993