Time-of-flight secondary ion mass spectrometry of perfluorinated polyethers
Bletsos, Ioannis V., Hercules, David M., VanLeyen, Dieter., Benninghoven, Alfred., Fowler, David.Volume:
62
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00212a015
Date:
July, 1990
File:
PDF, 1.17 MB
english, 1990