Optical band gaps and composition dependence of hafnium–aluminate thin films grown by atomic layer chemical vapor deposition
Nguyen, N. V., Sayan, S., Levin, I., Ehrstein, J. R., Baumvol, I. J. R., Driemeier, C., Krug, C., Wielunski, L., Hung, P. Y., Diebold, AlainVolume:
23
Year:
2005
Language:
english
DOI:
10.1116/1.2091096
File:
PDF, 513 KB
english, 2005