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Defect formation in heavily doped Si upon irradiation
Gubskaya, V. I., Kuchinskii, P. V., Lomako, V. M.Volume:
55
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337578108225462
Date:
January, 1981
File:
PDF, 308 KB
english, 1981