Degradation of AlGaN/GaN high-electron mobility transistors in the current-controlled off-state breakdown
Kuzmik, J., Jurkovič, M., Gregušová, D., Ťapajna, M., Brunner, F., Cho, M., Meneghesso, G., Würfl, J.Volume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4873301
Date:
April, 2014
File:
PDF, 750 KB
english, 2014