Utilizing Circuit Structure for Scan Chain Diagnosis

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2014 / 12 Vol. 22; Iss. 12

Utilizing Circuit Structure for Scan Chain Diagnosis

Lo, Wei-Hen, Hsieh, Ang-Chih, Lan, Chien-Ming, Lin, Min-Hsien, Hwang, TingTing
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Volume:
22
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2013.2294712
Date:
December, 2014
File:
PDF, 3.79 MB
english, 2014
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