[IEEE TENCON 2006 - 2006 IEEE Region 10 Conference - Hong...

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[IEEE TENCON 2006 - 2006 IEEE Region 10 Conference - Hong Kong, China (2006.11.14-2006.11.17)] TENCON 2006 - 2006 IEEE Region 10 Conference - CARATS: A Computer-Aided Reliability Assessment Tool for Software Based on Object-Oriented Design

Chen, Chien-Chia, Lin, Chu-Ti, Huang, Hen-Hsen, Huang, Shih-Wei, Huang, Chin-Yu
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Year:
2006
Language:
english
DOI:
10.1109/tencon.2006.344182
File:
PDF, 4.04 MB
english, 2006
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