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Negative Bias Temperature Instabilities induced in devices...

Negative Bias Temperature Instabilities induced in devices with millisecond anneal for ultra-shallow junctions

Moras, M., Martin-Martinez, J., Rodriguez, R., Nafria, M., Aymerich, X., Simoen, E.
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Volume:
101
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2014.06.036
Date:
November, 2014
File:
PDF, 1.44 MB
english, 2014
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