Extraction Method of Threshold Voltage and Transconductance...

Journal of Nuclear Science and Technology 1999 / 07 Vol. 36; Iss. 7

Extraction Method of Threshold Voltage and Transconductance to Assess Radiation Effects on MOS Circuits

CHANG-LIAO, Kuei-Shu, CHANG, Huang-Ming
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Volume:
36
Language:
english
Journal:
Journal of Nuclear Science and Technology
DOI:
10.1080/18811248.1999.9726248
Date:
July, 1999
File:
PDF, 260 KB
english, 1999
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