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Parametric Sensitivity, Runaway, and Safety in Batch Reactors: Experiments and Models
Shukla, Pavan K., Pushpavanam, S.Volume:
33
Language:
english
Journal:
Industrial & Engineering Chemistry Research
DOI:
10.1021/ie00036a039
Date:
December, 1994
File:
PDF, 771 KB
english, 1994