Limits of applicability of a time-of-flight ion-mass...

Radiation Effects and Defects in Solids 2010 / 10 Vol. 165; Iss. 6-10

Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources

Krása, J., Láska, L., Rohlena, K., Velyhan, A., Czarnecka, A., Parys, P., Ryć, L., Wolowski, J.
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Volume:
165
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420151003718402
Date:
October, 2010
File:
PDF, 804 KB
english, 2010
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