Molecular Depth Profiling with Cluster Secondary Ion Mass...

Analytical Chemistry 2010 / 01 Vol. 82; Iss. 1

Molecular Depth Profiling with Cluster Secondary Ion Mass Spectrometry and Wedges

Mao, Dan, Wucher, Andreas, Winograd, Nicholas
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Volume:
82
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac902313q
Date:
January, 2010
File:
PDF, 1.76 MB
english, 2010
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