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Electron irradiation-induced defects in lithium doped n-type silicon with different oxygen concentrations
Xiuchen Yao, Guogang Qin, Taotao Jia, Shouli Luo, Liqiao LanVolume:
129
Year:
1988
Language:
english
Pages:
5
DOI:
10.1016/0375-9601(88)90361-1
File:
PDF, 453 KB
english, 1988