Quantitative compositional analysis of InAs/GaAs quantum...

Journal of Applied Physics 2001 Vol. 89; Iss. 4

Quantitative compositional analysis of InAs/GaAs quantum dots by scanning transmission electron microscopy

Zhi, D., Davock, H., Murray, R., Roberts, C., Jones, T. S., Pashley, D. W., Goodhew, P. J., Joyce, B. A.
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Volume:
89
Year:
2001
Language:
english
DOI:
10.1063/1.1337921
File:
PDF, 635 KB
english, 2001
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