Physics-of-failure assessment methodology for power electronic systems
Squiller, D., Greve, H., Mengotti, E., McCluskey, F.P.Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.123
Date:
September, 2014
File:
PDF, 827 KB
english, 2014