Investigation of defects in amorphous silicon films using...

Physics Letters A 1989 Vol. 134; Iss. 8-9

Investigation of defects in amorphous silicon films using positron annihilation

Yang-Fang Chen, Chia-Chi Wang, Poh-Kun Tseng, Jun-Tseng Lue
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Volume:
134
Year:
1989
Language:
english
Pages:
4
DOI:
10.1016/0375-9601(89)90692-0
File:
PDF, 300 KB
english, 1989
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