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Fault Modeling on Complex Plane and Tolerance Handling Methods for Analog Circuits
Yang, Chenglin, Tian, Shulin, Liu, Zhen, Huang, Jianguo, Chen, FangVolume:
62
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.2013.2259732
Date:
October, 2013
File:
PDF, 9.91 MB
english, 2013