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Reliability improvement of conductive adhesives on tin (Sn) surfaces
Li, Yi, Moon, Kyoung-Sik, Wong, C. P.Volume:
19
Language:
english
Journal:
Journal of Adhesion Science and Technology
DOI:
10.1163/156856105774805822
Date:
January, 2005
File:
PDF, 873 KB
english, 2005