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[IEEE 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. - Honolulu, HI, USA (June 15-17, 2006)] 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. - An SRAM Design in 65nm and 45nm Technology Nodes Featuring Read and Write-Assist Circuits to Expand Operating Voltage
Pilo, H., Barwin, J., Braceras, G., Browning, C., Burns, S., Gabric, J., Lamphier, S., Miller, M., Roberts, A., Towler, F.Year:
2006
Language:
english
DOI:
10.1109/vlsic.2006.1705289
File:
PDF, 259 KB
english, 2006