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[IEEE 2011 IEEE 20th International Symposium on Industrial Electronics (ISIE) - Gdansk, Poland (2011.06.27-2011.06.30)] 2011 IEEE International Symposium on Industrial Electronics - Multidimensional intelligent diagnosis system based on Support Vector Machine Classifier
Delgado, M., Garcia, A., Ortega, J. A., Cardenas, J. J., Romeral, L.Year:
2011
Language:
english
DOI:
10.1109/isie.2011.5984489
File:
PDF, 786 KB
english, 2011