Thermal Stability of Pd Gate in Pseudomorphic InGaAs...

Japanese Journal of Applied Physics 2011 / 6 Vol. 50; Iss. 6

Thermal Stability of Pd Gate in Pseudomorphic InGaAs Heterostructures

Ishikura, Tomotsugu, Cui, Zhixin, Matsuda, Takashi, Yoh, Kanji
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Volume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.50.06gf19
Date:
June, 2011
File:
PDF, 409 KB
english, 2011
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