Deep traps and thermal measurements on AlGaN/GaN on Si...

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures 2011 Vol. 29; Iss. 4

Deep traps and thermal measurements on AlGaN/GaN on Si transistors

Lo, C. F., Ren, Fan, Pearton, S. J., Polyakov, A. Y., Smirnov, N. B., Govorkov, A. V., Belogorokhov, I. A., Belogorokhov, A. I., Reznik, V. Y., Johnson, J. W.
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Volume:
29
Year:
2011
Language:
english
DOI:
10.1116/1.3605304
File:
PDF, 562 KB
english, 2011
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