[IEEE 2013 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Daerah Langkawi, Malaysia (2013.09.25-2013.09.27)] RSM 2013 IEEE Regional Symposium on Micro and Nanoelectronics - A simulation study of thickness effect in performance of double lateral gate junctionless transistors
Larki, Farhad, Dehzangi, Arash, Hamidon, M.N., Ali, Sawal Hamid Md, Jalar, Azman, Islam, Md. ShabiulYear:
2013
Language:
english
DOI:
10.1109/rsm.2013.6706480
File:
PDF, 410 KB
english, 2013