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[IEEE 2014 IEEE 23rd International Symposium on Industrial Electronics (ISIE) - Istanbul, Turkey (2014.6.1-2014.6.4)] 2014 IEEE 23rd International Symposium on Industrial Electronics (ISIE) - Autonomous hole quality determination using image processing techniques
Kuzu, Ahmet, Kuzu, Ali T, Rahimzadeh, Kaveh, Bogasyan, Seta, Gokasan, Metin, Bakkal, MustafaYear:
2014
Language:
english
DOI:
10.1109/isie.2014.6864743
File:
PDF, 688 KB
english, 2014