Identification of Surface Defects and Subsurface Dopants in...

The Journal of Physical Chemistry C 2014 / 07 Vol. 118; Iss. 29

Identification of Surface Defects and Subsurface Dopants in a Delta-Doped System Using Simultaneous nc-AFM/STM and DFT

Spadafora, E. J., Berger, J., Mutombo, P., Telychko, M., Švec, M., Majzik, Z., McLean, A. B., Jelínek, P.
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Volume:
118
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/jp503410j
Date:
July, 2014
File:
PDF, 7.16 MB
english, 2014
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