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[IEEE Comput. Soc. Press International Test Conference 1990 - Washington, DC, USA (10-14 Sept. 1990)] Proceedings. International Test Conference 1990 - Direct access test scheme-design of block and core cells for embedded ASICs
Immaneni, V., Raman, S.Year:
1990
Language:
english
DOI:
10.1109/test.1990.114058
File:
PDF, 359 KB
english, 1990