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[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - Mechanisms and performance of metal oxide resistive RAM (RRAM)
Chen, An, Meneghini, Matteo, Van Blerkom, Daniel, Schanovsky, Franz, Shaw, TomYear:
2013
Language:
english
DOI:
10.1109/iirw.2013.6804191
File:
PDF, 62 KB
english, 2013